Inversão de dados em eletrorresistividade 1D usando o esquema de inversão de Occam

Abstract

This research focuses on the issue of one-dimensional (1D) electrical resistivity data inversion through the application of the Occam inversion scheme, aimed at evaluating its efficiency in reconstructing layers within the Earth’s model. This study aims to examine this scheme by using synthetic electrical resistivity data generated from a model with smooth transitions. The results confirm the accuracy of the Occam inversion scheme in reconstructing subsurface layer characteristics from 1D electrical resistivity data, highlighting its consistency in data interpretation and reliable reconstruction of geological properties. These findings reinforce the significance of the Occam inversion scheme as a promising tool for interpreting and modeling 1D electrical resistivity data, with a focus on subsurface characterization.